Imaging Graphene Moiré Superlattices via Scanning Kelvin Probe Microscopy

Moiré superlattices in van der Waals heterostructures are gaining increasing attention because they offer new opportunities to tailor and explore unique electronic phenomena. Using a combination of lateral piezoresponse force microscopy (LPFM) scanning Kelvin probe (SKPM), we directly correlate ABAB ABCA stacked graphene with local surface potential. We find that the potential domains is ?15 mV higher (smaller work function) than domains. First-principles calculations show different functions between arise from stacking-dependent structure. Moreover, while moiré superlattice visualized by LPFM can change time, imaging distribution via SKPM appears more stable, enabling mapping without tip–sample contact-induced effects. Our results provide means visualize domain stacking along its impact on properties.